Measurement of Single Event Phenomena (SEP) Induced by Heavy ION Irradiation of Semiconductor Devices (Metric) (S/S by ASTM-F1192)

General Information

Designation	ASTM-F1192M
Status	Withdrawn
Last Update	2018-05-29
Last Document Update	None
Publisher	Defense Standardization Program Office

Categories

FSG-59

FSC-5962

Document Category

American Society for Testing and Materials (ASTM)

History

Version	Date	Distribution Statement	Access	Pages
Notice - Withdrawal	2012-05-01	A	Public	1
Notice - Adoption, Tier 2	1999-07-14	A	Public	1

Responsibilities

Service	Organization	Code
Lead Standardization Activity	DLA Land and Maritime	CC
Preparing Activity	DLA Land and Maritime	CC
Air Force	Air Force Life Cycle Management Center - Electronic Components, Wire and Cable	85
Army	US Army Combat Capabilities Development Command, C5ISR Center	CR
DLA	DLA Land and Maritime	CC
Navy	Naval Information Warfare Systems Command	EC